Dr. Arturas Vailionis is a Senior Staff Scientist at Stanford Nano Shared Facilities, where he leads X-ray diffraction (XRD) and X-ray computed tomography (XCT) activities. With over two decades of experience, his work spans crystallographic analysis and high-resolution, non-destructive three-dimensional imaging. He specializes in XCT for quantitative characterization of microstructure, defects, and internal architectures at micrometer to nanometer scales, with increasing emphasis on in situ and multimodal approaches. His expertise in XRD enables detailed structural analysis of materials, while his XCT research advances imaging of both inorganic and biological systems to better understand structure-property relationships.